Mechanisms of Pressure Loss in Chamfered Orifice Plates: Coupled Effects of Plate Thickness and Reynolds Number
By: Yiqin Liu, Xinrong Liu and Huipeng Wang
DOI: https://doi.org/10.2478/msr-2026-0011 | Journal eISSN: 1335-8871
Language: English
Page range: 82 - 90
Submitted on: Dec 6, 2025
|Accepted on: Feb 19, 2026
|Published on: Mar 16, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2026 Yiqin Liu, Xinrong Liu, Huipeng Wang, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.