Mechanisms of Pressure Loss in Chamfered Orifice Plates: Coupled Effects of Plate Thickness and Reynolds Number
By: Yiqin Liu, Xinrong Liu and Huipeng Wang
Authors
School of Mechanical and Automotive Engineering, Shanghai University of Engineering Science, Shanghai, China
Huipeng Wang
School of Mechanical and Automotive Engineering, Shanghai University of Engineering Science, Shanghai, China
DOI: https://doi.org/10.2478/msr-2026-0011 | Journal eISSN: 1335-8871
Language: English
Page range: 82 - 90
Submitted on: Dec 6, 2025
Accepted on: Feb 19, 2026
Published on: Mar 16, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2026 Yiqin Liu, Xinrong Liu, Huipeng Wang, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.