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Coupled Defect Level Recombination in the P—N Junction Cover

Coupled Defect Level Recombination in the P—N Junction

Journal of Electrical Engineering
Volume 62 (2011): Issue 6 (November 2011)
By: ,  ,  ,  ,  ,   and    
Open Access
|Dec 2011
Authors

Authors

Juraj Racko

Miroslav Mikolášek

Peter Benko

Ondrej Gallo

Ladislav Harmatha

Ralf Granzner

Frank Schwierz

DOI: https://doi.org/10.2478/v10187-011-0056-5 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 355 - 358
Published on: Dec 21, 2011
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
tunneling,
coupled levels
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2011 Juraj Racko, Miroslav Mikolášek, Peter Benko, Ondrej Gallo, Ladislav Harmatha, Ralf Granzner, Frank Schwierz, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 6 (November 2011)