Coupled Defect Level Recombination in the P—N Junction
By: Juraj Racko, Miroslav Mikolášek, Peter Benko, Ondrej Gallo, Ladislav Harmatha, Ralf Granzner and Frank Schwierz
Open Access
|Dec 2011References
- ISE Integrated System Engineering, Release 7.0, Volume 4a (1995), p. 12 215.
- SCHENK, A.—KRUMBEIN, U.: Coupled Defect Recombination: Theory and Application to Anomalous Diode Characteristics, J. Appl. Phys.(1995), 3185.
- RACKO, J.: Unpublished results.
DOI: https://doi.org/10.2478/v10187-011-0056-5 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
Language: English
Page range: 355 - 358
Published on: Dec 21, 2011
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
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© 2011 Juraj Racko, Miroslav Mikolášek, Peter Benko, Ondrej Gallo, Ladislav Harmatha, Ralf Granzner, Frank Schwierz, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.