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Coupled Defect Level Recombination in the P—N Junction Cover

Coupled Defect Level Recombination in the P—N Junction

Open Access
|Dec 2011
DOI: https://doi.org/10.2478/v10187-011-0056-5 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 355 - 358
Published on: Dec 21, 2011
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2011 Juraj Racko, Miroslav Mikolášek, Peter Benko, Ondrej Gallo, Ladislav Harmatha, Ralf Granzner, Frank Schwierz, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 6 (November 2011)