On Measurement Uncertainty of ADC Nonlinearities in Oscillation-Based Test

Peter Mrak; Anton Biasizzo; Franc Novak

doi:10.2478/v10187-011-0057-4

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On Measurement Uncertainty of ADC Nonlinearities in Oscillation-Based Test

Journal of Electrical Engineering

Volume 62 (2011): Issue 6 (November 2011)

By: Peter Mrak, Anton Biasizzo and Franc Novak

Open Access

|Dec 2011

Abstract

Oscillation-based test (OBT) is one of the approaches for measuring static ADC parameters such as differential nonlinearity (DNL) and integral nonlinearity (INL) that can be implemented in a built-in self-test arrangement. When applying the OBT approach in practice we noticed an inherent measurement uncertainty related to the slope of the ADC input signal in OBT test mode. Experimental environment in Matlab has been set up to study the phenomenon. Experiments with varying values of slope were performed to demonstrate the margins of DNL measurement uncertainty.

References

ARABI, K.—KAMINSKA, B.: Oscillation-Test Strategy for Analog and Mixed-Signal Circuits, Proc. VLSI Test Symposium yr1996, 476-482.
Search in Google Scholar
ARABI, K.—KAMINSKA, B.: Design for Testability of Integrated Operational Amplifiers Using Oscillation-Test Strategy, Proc. ICCD (1996), 40-45.
Search in Google Scholar
ARABI, K.—KAMINSKA, B.: Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method, IEEE Transactions on CAD 16 No. 7 (1997), 745-753.10.1109/43.644035
Search in Google Scholar
HUERTAS, G.—VAZQUEZ, D.—RUEDA, A.—HUERTAS, J. L.: Effective Oscillation-Based Test for Application to a DTMF Filter Bank, Proc. IEEE ITC (1999), 549-555.
Search in Google Scholar
SANTO ZARNIK, M.—NOVAK, F.—MACEK, S.: Design of Oscillation-Based Test Structures for Active RC Filters, IEEE Proc.-Circuits Devices Syst. 147 No. 5 (2000), 297-302.10.1049/ip-cds:20000601
Search in Google Scholar
DIAS, P. M.—FRANCA, J. E.—PAULINO, N.: Oscillation Test Methodology for a Digitally-Programmable Switched-Current Biquad, Proc. IEEE Int'l Mixed Signal Testing Workshop, 1996, pp. 221-226.
Search in Google Scholar
ARABI, K.—KAMINSKA, B.: Oscillation Built-in Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits, Proc. International Test Conference, 1997, pp. 786-795.
Search in Google Scholar
HUERTAS, G.—VAZQUEZ, D.—RUEDA, A.—HUERTAS, J. L.: Oscillation-Based Test in Bandpass Oversampled A/D Converters, Microelectronics Journal 34 No. 10 (2003), 927-936.10.1016/S0026-2692(03)00163-0
Search in Google Scholar
HUERTAS, J. L.: Test and Desgin-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, Dordrecht, 2004.10.1007/978-0-387-23521-9
Search in Google Scholar
SANCHEZ, G. H.—DE LA VEGA, D. V. G.—RUEDA, A. R.—DIAZ, J. L. H.: Oscillation-Based Test in Mixed-Signal Circuits, Springer, Dordrecht, 2006.10.1007/1-4020-5315-0
Search in Google Scholar
SANTO ZARNIK, M.—NOVAK, F.—MACEK, S.: Efficient Go No-Go Test of Active RC Filters, Int. J. of Circuit Theory and Applications 26 No. 5 (1998), 523-529.10.1002/(SICI)1097-007X(199809/10)26:5<;523::AID-CTA27>3.0.CO;2-2
Search in Google Scholar
HUERTAS, G.—VAZQUEZ, D.—PERALIAS, E. J.—RUEDA, A.—HUERTAS, J. L.: Testing Mixed-Signal Cores: a Practical Oscillation-Based Test in an Analog Macrocell, IEEE Design & Test of Computers, 19 No. 6 (2002), 73-82.
Search in Google Scholar
RAGHUNATHAN, A.—SHIN, H. J.—ABRAHAM, J. A.—CHATTERJEE, A.: Prediction of Analog Performance Parameters Using Oscillation Based Test, 22^nd IEEE VLSI Test Symposium (VTS), 2004, pp. 377-382.
Search in Google Scholar
RAGHUNATHAN, A.—CHUN, J. H. P.—ABRAHAM, J. A.—CHATTERJEE, A.: Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters, Proc. Int. Test Conference, 2004, pp. 252-261.
Search in Google Scholar
VAZQUEZ, D.—HUERTAS, G.—LEGER, G.—RUEDA, A.—HUERTAS, J. L.: Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation, Proc. 20^th IEEE VLSI Test Symposium (VTS), 2002, pp. 433-438.
Search in Google Scholar
MRAK, P.—BIASSIZO, A.—NOVAK, F.: Measurement Accuracy of Oscillation Based Test of Analog-To-Digital Converters, ETRI Journal 32 No. 1 (2010), 154-156.10.4218/etrij.10.0209.0285
Search in Google Scholar

Articles in this issue

DOI: https://doi.org/10.2478/v10187-011-0057-4 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632

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Language: English

Page range: 359 - 362

Published on: Dec 21, 2011

Published by: Slovak University of Technology in Bratislava

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

Keywords:

oscillation-based test,

analog-to-digital converter,

differential nonlinearity

Related subjects:

Engineering,

Introductions and overviews,

Engineering, other

© 2011 Peter Mrak, Anton Biasizzo, Franc Novak, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 6 (November 2011)