Measurement of nanopatterned surfaces by real and reciprocal space techniques
By: P. Siffalovic, K. Vegso, M. Jergel, E. Majkova, J. Keckes, G. Maier, M. Cornejo, B. Ziberi, F. Frost, B. Hasse and J. Wiesmann
Open Access
|Dec 2010DOI: https://doi.org/10.2478/v10048-010-0027-1 | Journal eISSN: 1335-8871
Language: English
Page range: 153 - 156
Published on: Dec 21, 2010
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2010 P. Siffalovic, K. Vegso, M. Jergel, E. Majkova, J. Keckes, G. Maier, M. Cornejo, B. Ziberi, F. Frost, B. Hasse, J. Wiesmann, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.