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Measurement Science Review
Volume 10 (2010): Issue 5 (October 2010)
Volume 10 (2010): Issue 5 (Jan 2010)
Measurement Science Review
Open Access
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Measurement Science Review
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Volume 25 (2025)
Volume 24 (2024)
Volume 23 (2023)
Volume 22 (2022)
Volume 21 (2021)
Volume 20 (2020)
Volume 19 (2019)
Volume 18 (2018)
Volume 17 (2017)
Volume 16 (2016)
Volume 15 (2015)
Volume 14 (2014)
Volume 13 (2013)
Volume 12 (2012)
Volume 11 (2011)
Volume 10 (2010)
Issue 6 (December 2010)
Issue 5 (October 2010)
Issue 4 (August 2010)
Issue 3 (June 2010)
Issue 2 (April 2010)
Issue 1 (February 2010)
Volume 9 (2009)
Volume 8 (2008)
6 articles
Open Access
|
Dec 2010
Abstract
Influence of interface cables termination impedance on radiated emission measurement
M. Bittera
and
V. Smiesko
Open Access
|
Dec 2010
Abstract
Low-Cost Embedded Oximeter
M. Laghrouche
,
S. Haddab
,
S. Lotmani
,
K. Mekdoud
and
S. Ameur
Open Access
|
Dec 2010
Abstract
Measurement of Viscoelastic Properties of Condensed Matter using Magnetic Resonance Elastography
Marco Gruwel
,
Peter Latta
,
Brendon Matwiy
,
Uta Sboto-Frankenstein
,
Patricia Gervai
and
Boguslaw Tomanek
Open Access
|
Dec 2010
Abstract
Non-Intrusive Device for Real-Time Circulatory System Assessment with Advanced Signal Processing Capabilities
E. Pinheiro
,
O. Postolache
and
P. Girão
Open Access
|
Dec 2010
Abstract
Measurement of nanopatterned surfaces by real and reciprocal space techniques
P. Siffalovic
,
K. Vegso
,
M. Jergel
,
E. Majkova
,
J. Keckes
,
G. Maier
,
M. Cornejo
,
B. Ziberi
,
F. Frost
,
B. Hasse
and
J. Wiesmann
Open Access
|
Dec 2010
Abstract
Modified Langmuir-Blodgett deposition of nanoparticles - measurement of 2D to 3D ordered arrays
L. Chitu
,
P. Siffalovic
,
E. Majkova
,
M. Jergel
,
K. Vegso
,
S. Luby
,
I. Capek
,
A. Satka
,
J. Perlich
,
A. Timmann
,
S. Roth
,
J. Keckes
and
G. Maier
eISSN:
1335-8871
|
Language:
English
|
Publication frequency:
6 times per year
Published by:
Slovak Academy of Sciences, Mathematical Institute
In partnership with:
Paradigm Publishing Services
Related subjects:
Engineering
,
Electrical engineering
,
Control engineering, metrology and testing
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