Modified Langmuir-Blodgett deposition of nanoparticles - measurement of 2D to 3D ordered arrays

L. Chitu; P. Siffalovic; E. Majkova; M. Jergel; K. Vegso; S. Luby; I. Capek; A. Satka; J. Perlich; A. Timmann; S. Roth; J. Keckes; G. Maier

doi:10.2478/v10048-010-0028-0

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Modified Langmuir-Blodgett deposition of nanoparticles - measurement of 2D to 3D ordered arrays

Measurement Science Review

Volume 10 (2010): Issue 5 (October 2010)

By: L. Chitu, P. Siffalovic, E. Majkova, M. Jergel, K. Vegso, S. Luby, I. Capek, A. Satka, J. Perlich, A. Timmann, S. Roth, J. Keckes and G. Maier

Open Access

|Dec 2010

Abstract

The ordered nanoparticle monolayers and multilayers over macroscopic areas were prepared by the modified Langmuir-Blodgett method. Using this approach, the nanoparticle monolayer is formed on the water surface by compression and subsequently it is transferred onto the substrate by a controlled removal of the water subphase. The ordering and homogeneity of the prepared mono- and multilayers was studied by scanning electron microscope (SEM), grazing-incidence small-angle X-ray scattering (GISAXS) and X-ray reflectivity (XRR) techniques. From the results it follows that an ordered nanoparticle monolayer was formed over a large area. For the multilayer, the layering and lateral ordering of each layer was confirmed by XRR and SEM performed after the deposition of each nanoparticle layer.

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Articles in this issue

DOI: https://doi.org/10.2478/v10048-010-0028-0 | Journal eISSN: 1335-8871

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Language: English

Page range: 162 - 165

Published on: Dec 21, 2010

Published by: Slovak Academy of Sciences, Institute of Measurement Science

In partnership with: Paradigm Publishing Services

Publication frequency: Volume open

Keywords:

GISAXS,

Related subjects:

Electrical engineering,

Control engineering, metrology and testing

© 2010 L. Chitu, P. Siffalovic, E. Majkova, M. Jergel, K. Vegso, S. Luby, I. Capek, A. Satka, J. Perlich, A. Timmann, S. Roth, J. Keckes, G. Maier, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 10 (2010): Issue 5 (October 2010)