Volume 9 (2009): Issue 1 (Jan 2009)

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Measurement Science Review

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4 articles

Open Access

|Apr 2009

Quantum Imaging X—ray CT Systems Based on GaAs Radiation Detectors Using Perspective Imaging Reconstruction Techniques

J. Přibil, B. Zat'ko, I. Frollo, F. Dubecký, P. Ščepko and J. Mudroň

Open Access

|Apr 2009

Exact Likelihood Ratio Test for the Parameters of the Linear Regression Model with Normal Errors

Martina Chvosteková and Viktor Witkovský

Open Access

|Apr 2009

Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers

K. Meiners-Hagen, R. Schödel, F. Pollinger and A. Abou-Zeid

Open Access

|Apr 2009

Critical Values for Testing Location-Scale Hypothesis

František Rublík

eISSN: 1335-8871|Language: English|Publication frequency: Volume open

Published by: Slovak Academy of Sciences, Institute of Measurement Science

In partnership with: Paradigm Publishing Services

Related subjects:

Engineering,

Electrical engineering,

Control engineering, metrology and testing

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Volume 9 (2009): Issue 1 (Jan 2009)

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