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A Method for ADC Error Testing and its Compensation in Ratiometric Measurements
By: K. Hariharan, P. Vasanthakumar, G. Varun and V. Abhaikumar
Open Access
|May 2010DOI: https://doi.org/10.2478/v10048-010-0009-3 | Journal eISSN: 1335-8871
Language: English
Page range: 56 - 59
Published on: May 14, 2010
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
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© 2010 K. Hariharan, P. Vasanthakumar, G. Varun, V. Abhaikumar, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.