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A Method for ADC Error Testing and its Compensation in Ratiometric Measurements Cover

A Method for ADC Error Testing and its Compensation in Ratiometric Measurements

Open Access
|May 2010

Abstract

Errors induced due to ratiometric measurements are discussed and a simplified compensation method to reduce the various static errors of ADC, voltage reference errors in ratiometry and resistance mismatch errors is proposed. Curve fitting is done for the error samples and the system is modelled in comparison to an ideal system. Static errors and other ratiometric errors, thus modelled are derived into a corrective equation in comparison with an errorless system. Implementation of the proposed method is discussed for a resistance measurement system and analyzed. This paper also discusses the usage of the proposed system with successive approximation ADCs for ratiometric measurement operations against the conventional requirement dual slope ADCs for the same.

Language: English
Page range: 56 - 59
Published on: May 14, 2010
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open

© 2010 K. Hariharan, P. Vasanthakumar, G. Varun, V. Abhaikumar, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 10 (2010): Issue 2 (April 2010)