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A Method for ADC Error Testing and its Compensation in Ratiometric Measurements Cover

A Method for ADC Error Testing and its Compensation in Ratiometric Measurements

Measurement Science Review
Volume 10 (2010): Issue 2 (April 2010)
By: K. Hariharan,  P. Vasanthakumar,  G. Varun and  V. Abhaikumar  
Open Access
|May 2010

Authors

K. Hariharan

P. Vasanthakumar

G. Varun

V. Abhaikumar

DOI: https://doi.org/10.2478/v10048-010-0009-3 | Journal eISSN: 1335-8871
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Language: English
Page range: 56 - 59
Published on: May 14, 2010
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Ratio-metric Measurements,
Curve Fitting,
ADC Error Testing,
Error Compensation
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2010 K. Hariharan, P. Vasanthakumar, G. Varun, V. Abhaikumar, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 10 (2010): Issue 2 (April 2010)