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Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers Cover

Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers

Measurement Science Review
Volume 9 (2009): Issue 1 (February 2009)
By: K. Meiners-Hagen,  R. Schödel,  F. Pollinger and  A. Abou-Zeid  
Open Access
|Apr 2009

Authors

K. Meiners-Hagen

R. Schödel

F. Pollinger

A. Abou-Zeid

DOI: https://doi.org/10.2478/v10048-009-0001-y | Journal eISSN: 1335-8871
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Language: English
Page range: 16 - 26
Published on: Apr 20, 2009
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
interferometry,
diode laser,
length measurement,
long distance,
surface profile,
gauge blocks
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2009 K. Meiners-Hagen, R. Schödel, F. Pollinger, A. Abou-Zeid, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 9 (2009): Issue 1 (February 2009)