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Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers Cover

Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers

Open Access
|Apr 2009

Abstract

This paper describes the principle of precise length measurements using multi-wavelength interferometry. Three different examples are given in order to demonstrate PTB's ability in this field: 1) Measurements of absolute distances up to 10 m performed by combination of the variable wavelength interferometry with fixed wavelength interferometry using two wavelengths simultaneously, 2) a three-wavelength diode laser interferometer for precision measurements of surface profiles (< 100 μm) and 3) PTB's Precision Interferometer for length measurements of prismatic bodies, e.g. gauge blocks, using three wavelengths. The setup and principle of measurements and some results are presented and discussed in each case.

Language: English
Page range: 16 - 26
Published on: Apr 20, 2009
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open

© 2009 K. Meiners-Hagen, R. Schödel, F. Pollinger, A. Abou-Zeid, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 9 (2009): Issue 1 (February 2009)