Low-Frequency Noise Measurement of High-Ohm Resistors
By: Lukáš Zdražil, Zdeněk Roubal and Jan Mikulka
References
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DOI: https://doi.org/10.2478/msr-2026-0025 | Journal eISSN: 1335-8871
Language: English
Page range: 198 - 208
Submitted on: Dec 7, 2025
Accepted on: Jun 8, 2026
Published on: Jul 14, 2026
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2026 Lukáš Zdražil, Zdeněk Roubal, Jan Mikulka, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.