The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
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DOI: https://doi.org/10.2478/msr-2026-0019 | Journal eISSN: 1335-8871
Language: English
Page range: 153 - 160
Submitted on: Nov 6, 2025
Accepted on: Apr 13, 2026
Published on: May 20, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
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© 2026 Krzysztof Dziarski, Arkadiusz Hulewicz, Przemysław Otomański, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.