The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element
Authors
krzysztof.dziarski@put.poznan.pl
Faculty of Environmental Engineering and Energy, Institute of Electric Power Engineering, Poznan University of Technology, Poznan, Poland
arkadiusz.hulewicz@put.poznan.pl
Faculty of Control, Robotics and Electrical Engineering, Institute of Electrical Engineering and Electronics, Poznan University of Technology, Poznan, Poland
Przemysław Otomański
przemyslaw.otomanski@put.poznan.pl
Faculty of Control, Robotics and Electrical Engineering, Institute of Electrical Engineering and Electronics, Poznan University of Technology, Poznan, Poland
DOI: https://doi.org/10.2478/msr-2026-0019 | Journal eISSN: 1335-8871
Language: English
Page range: 153 - 160
Submitted on: Nov 6, 2025
Accepted on: Apr 13, 2026
Published on: May 20, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Related subjects:
© 2026 Krzysztof Dziarski, Arkadiusz Hulewicz, Przemysław Otomański, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.