Authors
Rumeng Wang
School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China
Department of Electronic Engineering, National Chin-Yi University of Technology, Taichung, Taiwan
Yan Zhang
School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China
Jiayi Chai
School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China