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Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation Cover

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Measurement Science Review
Volume 19 (2019): Issue 4 (August 2019)
By: Pavel Fiala,  Karel Bartušek,  Jarmila Dědková,  Radim Kadlec and  Přemysl Dohnal  
Open Access
|Aug 2019

References

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DOI: https://doi.org/10.2478/msr-2019-0020 | Journal eISSN: 1335-8871
Journal RSS Feed
Language: English
Page range: 144 - 152
Submitted on: Feb 25, 2019
|
Accepted on: Jul 30, 2019
|
Published on: Aug 24, 2019
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nanomaterials,
multilayered material,
resonance,
periodic system,
electromagnetic wave,
X-ray,
gamma-ray,
antireflection,
shielding
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2019 Pavel Fiala, Karel Bartušek, Jarmila Dědková, Radim Kadlec, Přemysl Dohnal, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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