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Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation Cover

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Open Access
|Aug 2019

Abstract

We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell’s law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.

Language: English
Page range: 144 - 152
Submitted on: Feb 25, 2019
Accepted on: Jul 30, 2019
Published on: Aug 24, 2019
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open

© 2019 Pavel Fiala, Karel Bartušek, Jarmila Dědková, Radim Kadlec, Přemysl Dohnal, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.