Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation
Authors
Karel Bartušek
Institute of Scientific Instruments of the ASCR v.v.i., Brno
Jarmila Dědková
Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Brno
Radim Kadlec
Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Brno
Přemysl Dohnal
Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Brno
DOI: https://doi.org/10.2478/msr-2019-0020 | Journal eISSN: 1335-8871
Language: English
Page range: 144 - 152
Submitted on: Feb 25, 2019
Accepted on: Jul 30, 2019
Published on: Aug 24, 2019
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Related subjects:
© 2019 Pavel Fiala, Karel Bartušek, Jarmila Dědková, Radim Kadlec, Přemysl Dohnal, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.