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Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation Cover

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Measurement Science Review
Volume 19 (2019): Issue 4 (August 2019)
By: Pavel Fiala,  Karel Bartušek,  Jarmila Dědková,  Radim Kadlec and  Přemysl Dohnal  
Open Access
|Aug 2019

Authors

Pavel Fiala

fialap@feec.vutbr.cz

SIX Research Center, Brno University of Technology, Brno

Karel Bartušek

Institute of Scientific Instruments of the ASCR v.v.i., Brno

Jarmila Dědková

Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Brno

Radim Kadlec

Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Brno

Přemysl Dohnal

Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology, Brno
DOI: https://doi.org/10.2478/msr-2019-0020 | Journal eISSN: 1335-8871
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Language: English
Page range: 144 - 152
Submitted on: Feb 25, 2019
|
Accepted on: Jul 30, 2019
|
Published on: Aug 24, 2019
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nanomaterials,
multilayered material,
resonance,
periodic system,
electromagnetic wave,
X-ray,
gamma-ray,
antireflection,
shielding
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2019 Pavel Fiala, Karel Bartušek, Jarmila Dědková, Radim Kadlec, Přemysl Dohnal, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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