Abstract
The uncertainty of measurements associated with the following correction methods: advanced correction of additive linear drift, correction of additive and multiplicative effects, as well as joint correction of a linear drift and systematic additive and multiplicative effects is analyzed in the present article. For each correction method sensitivity coefficients and amplitude responses according to which noise and internal and external interferences influence the corrected measurement result have been determined. Besides uncertainty of reference quantities, the main factors which limit the efficiency of correction are: non-linearity of measurement function including non-linearity of ADC, no idealities of the switching systems and external and internal noises and periodic interferences. The efficiency of correction of systematic additive and multiplicative effects was studied for the multifunction 16 bit PCI DAQ of family NI 6250.