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DT-CWT Robust Filtering Algorithm for The Extraction of Reference and Waviness from 3-D Nano Scalar Surfaces Cover

DT-CWT Robust Filtering Algorithm for The Extraction of Reference and Waviness from 3-D Nano Scalar Surfaces

Measurement Science Review
Volume 14 (2014): Issue 2 (April 2014)
By: Zhi Ying. Ren,  ChengHui. Gao,  GuoQiang. Han,  Shen Ding and  JianXing. Lin  
Open Access
|May 2014

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DOI: https://doi.org/10.2478/msr-2014-0012 | Journal eISSN: 1335-8871
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Language: English
Page range: 87 - 93
Submitted on: May 28, 2013
|
Accepted on: Apr 11, 2014
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Published on: May 8, 2014
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
3-D nano scale,
DT-CWT robust filtering,
reference,
waviness
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2014 Zhi Ying. Ren, ChengHui. Gao, GuoQiang. Han, Shen Ding, JianXing. Lin, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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