Abstract
Dual tree complex wavelet transform (DT-CWT) exhibits superiority of shift invariance, directional selectivity, perfect reconstruction (PR), and limited redundancy and can effectively separate various surface components. However, in nano scale the morphology contains pits and convexities and is more complex to characterize. This paper presents an improved approach which can simultaneously separate reference and waviness and allows an image to remain robust against abnormal signals. We included a bilateral filtering (BF) stage in DT-CWT to solve imaging problems. In order to verify the feasibility of the new method and to test its performance we used a computer simulation based on three generations of Wavelet and Improved DT-CWT and we conducted two case studies. Our results show that the improved DT-CWT not only enhances the robustness filtering under the conditions of abnormal interference, but also possesses accuracy and reliability of the reference and waviness from the 3-D nano scalar surfaces.