Scanning capacitance microscopy characterization of AIIIBV epitaxial layers
Authors
Michał Obłąk
Poland
Tomasz Szymański
Poland
Mateusz Wośko
Poland
Wojciech Dawidowski
Poland
Regina Paszkiewicz
Poland
DOI: https://doi.org/10.1515/msp-2016-0104 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Language: English
Page range: 845 - 850
Submitted on: Apr 19, 2016
Accepted on: Sep 7, 2016
Published on: Jan 4, 2017
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
Related subjects:
© 2017 Adam Szyszka, Michał Obłąk, Tomasz Szymański, Mateusz Wośko, Wojciech Dawidowski, Regina Paszkiewicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.