Fabrication and characterization of Si/SiO2/TiO2/ZnO heterostructures from sputtered and oxidized Ti-film
Authors
Jaroslav Kováč
Institute of Electronics and Photonics, Slovak University of Technology in Bratislava, Bratislava, Slovakia
Martin Florovič
Institute of Electronics and Photonics, Slovak University of Technology in Bratislava, Bratislava, Slovakia
Andrej Vincze
International Laser Center Bratislava, Bratislava, Slovakia
Edmund Dobročka
Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovakia
Ivan Novotný
Institute of Electronics and Photonics, Slovak University of Technology in Bratislava, Bratislava, Slovakia
Miroslav Mikolášek
Institute of Electronics and Photonics, Slovak University of Technology in Bratislava, Bratislava, Slovakia
Jaroslava Škriniarová
Institute of Electronics and Photonics, Slovak University of Technology in Bratislava, Bratislava, Slovakia
Language: English
Page range: 58 - 61
Submitted on: Apr 23, 2017
Published on: Dec 29, 2017
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
Related subjects:
© 2017 Jaroslav Kováč, Martin Florovič, Andrej Vincze, Edmund Dobročka, Ivan Novotný, Miroslav Mikolášek, Jaroslava Škriniarová, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.