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Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5 Cover

Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5

Open Access
|Sep 2024

Figures & Tables

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Figure 1

Overview of the Blazor server architecture.

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Figure 2

User interface for identification of an unknown spectral line.

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Figure 3

Details summary screen for a specific entry from a publication. Additionally, ‘All Records in this Publication’ had been selected on a previous screen to provide all data from the selected publication. The DOI may be clicked which will direct the user to the journal homepage for the article.

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Figure 4

Matches from a search for additional data from a selected citation.

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Figure 5

List of Nb-containing materials and compounds from the database with data for the Nb 3d5/2 orbital.

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Figure 6

(left) Display of a binding-energy chemical-shift plot for Nb and selected Nb compounds for the Nb 3d5/2 photoelectron line. (right) Summary table for Nb and 11 Nb compounds used for the chemical-shift plot in Figure 5 (left).

Table 1

New processes and tools developed for creating new features in the NIST XPS Database Version 5.0.

NEW TO SRD 20 V 5.0
FEATUREDESCRIPTIONLOCATION DESCRIBED
Web ArchitectureCross-platform, open-source .NET framework, EF Core framework, Blazor Server frameSection 2.2
Data ValidatorCustom validators for checking users’ inputSection 2.3, SI Section 1
Chemical Shift PlotsNew algorithm was designed to draw the chemical shift plot in the HTML5 CanvasSection 2.4, SI Section 6
Molecular FormatterConverts a molecular formula from plain text into a standard chemical formulaSection 2.4, SI Section 3
Orbital FormatterConverts orbital text into a physically meaningful formatSection 2.4, SI Section 4
Language: English
Submitted on: Dec 12, 2023
Accepted on: Aug 20, 2024
Published on: Sep 18, 2024
Published by: Ubiquity Press
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year

© 2024 Angela Y. Lee, Cedric J. Powell, Justin M. Gorham, Adam Morey, John Henry J. Scott, Robert J. Hanisch, published by Ubiquity Press
This work is licensed under the Creative Commons Attribution 4.0 License.