Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5
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DOI: https://doi.org/10.5334/dsj-2024-045 | Journal eISSN: 1683-1470
Language: English
Page range: 45 - 45
Submitted on: Dec 12, 2023
Accepted on: Aug 20, 2024
Published on: Sep 18, 2024
Published by: Ubiquity Press
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
© 2024 Angela Y. Lee, Cedric J. Powell, Justin M. Gorham, Adam Morey, John Henry J. Scott, Robert J. Hanisch, published by Ubiquity Press
This work is licensed under the Creative Commons Attribution 4.0 License.