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Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5 Cover

Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5

Data Science Journal
Volume 23 (2024): Issue 1
By: Angela Y. Lee,  Cedric J. Powell,  Justin M. Gorham,  Adam Morey,  John Henry J. Scott and  Robert J. Hanisch  
Open Access
|Sep 2024

Authors

Angela Y. Lee

leea@nist.gov

Office of Data and Informatics, National Institute of Standards and Technology, Gaithersburg

Cedric J. Powell

cedric.powell@nist.gov

Nano Materials Research Group, National Institute of Standards and Technology, Gaithersburg

Justin M. Gorham

justin.gorham@nist.gov

Nano Materials Research Group, National Institute of Standards and Technology, Gaithersburg

Adam Morey

adam.morey@nist.gov

Office of Data and Informatics, National Institute of Standards and Technology, Gaithersburg

John Henry J. Scott

johnhenry.scott@nist.gov

Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg

Robert J. Hanisch

robert.hanisch@nist.gov

Office of Data and Informatics, National Institute of Standards and Technology, Gaithersburg
DOI: https://doi.org/10.5334/dsj-2024-045 | Journal eISSN: 1683-1470
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Language: English
Submitted on: Dec 12, 2023
Accepted on: Aug 20, 2024
Published on: Sep 18, 2024
Published by: Ubiquity Press
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
X-ray photoelectron spectroscopy,
Standard Reference Data,
Database,
.NET Core Blazor Server Web Application,
Entity Framework Core

© 2024 Angela Y. Lee, Cedric J. Powell, Justin M. Gorham, Adam Morey, John Henry J. Scott, Robert J. Hanisch, published by Ubiquity Press
This work is licensed under the Creative Commons Attribution 4.0 License.

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