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Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5 Cover

Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5

Open Access
|Sep 2024

Abstract

It has been over 20 years since the National Institute of Standards and Technology (NIST) launched the first web version of its X-ray Photoelectron Spectroscopy (XPS) database (Lee et al., 2002; Wagner, 1991) which has approximately 1000 active users every day. This database was recently redesigned to meet NIST security requirements and to include new features and enhancements. The new application is built upon a relational database using a cross-platform and open-source framework (Henning et al., 2002). In addition to a modern design interface, the new features include custom-built components for displaying formatted molecular formulas and spectral lines, for sorting spectral lines, and for graphical display of chemical shifts of binding energies, Auger-electron kinetic energies, and Auger parameters for elements in different compounds.

Language: English
Submitted on: Dec 12, 2023
Accepted on: Aug 20, 2024
Published on: Sep 18, 2024
Published by: Ubiquity Press
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year

© 2024 Angela Y. Lee, Cedric J. Powell, Justin M. Gorham, Adam Morey, John Henry J. Scott, Robert J. Hanisch, published by Ubiquity Press
This work is licensed under the Creative Commons Attribution 4.0 License.