Evaluation of AlGaN/GaN heterostructures properties by QMSA and AFM techniques
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DOI: https://doi.org/10.2478/s13536-013-0135-3 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Language: English
Page range: 543 - 547
Published on: Dec 15, 2013
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
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© 2013 Adam Szyszka, Mateusz Wośko, Bogdan Paszkiewicz, Marek Tłaczała, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.