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Evaluation of AlGaN/GaN heterostructures properties by QMSA and AFM techniques Cover

Evaluation of AlGaN/GaN heterostructures properties by QMSA and AFM techniques

Materials Science-Poland
Volume 31 (2013): Issue 4 (October 2013)
By: Adam Szyszka,  Mateusz Wośko,  Bogdan Paszkiewicz and  Marek Tłaczała  
Open Access
|Dec 2013

Authors

Adam Szyszka

adam.szyszka@pwr.wroc.pl

Mateusz Wośko

Bogdan Paszkiewicz

Marek Tłaczała

DOI: https://doi.org/10.2478/s13536-013-0135-3 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 543 - 547
Published on: Dec 15, 2013
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
AlGaN/GaN,
Hall mobility,
AFM,
Quantive Mobility Spectrum Analysis
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2013 Adam Szyszka, Mateusz Wośko, Bogdan Paszkiewicz, Marek Tłaczała, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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