Analysis of MIS equivalent electrical circuit of Au/Pd/Ti-SiO2-GaAs structure based on DLTS measurements Cover

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Analysis of MIS equivalent electrical circuit of Au/Pd/Ti-SiO2-GaAs structure based on DLTS measurements

Materials Science-Poland

Volume 31 (2013): Issue 3 (August 2013)

By: S. Kochowski, Ł. Drewniak, K. Nitsch, R. Paszkiewicz and B. Paszkiewicz

Open Access

|Aug 2013

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DOI: https://doi.org/10.2478/s13536-013-0124-6 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 446 - 453

Published on: Aug 29, 2013

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

interface states,

admittance spectroscopy,

Related subjects:

Materials sciences,

Materials sciences, other,

Functional and smart materials,

Materials characterization and properties

© 2013 S. Kochowski, Ł. Drewniak, K. Nitsch, R. Paszkiewicz, B. Paszkiewicz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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