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Statistical and Metrological Framework for Evaluation of micro-CT 3D Data with Application to Dental Implant Components Cover

Statistical and Metrological Framework for Evaluation of micro-CT 3D Data with Application to Dental Implant Components

Open Access
|Oct 2026

Figures & Tables

Fig. 1.

μCT-derived 3D model of the three-component titanium implant assembly: (a) semi-transparent rendering revealing the individual components; (b) opaque rendering. The scale bar indicates 3 mm.

Fig. 2.

Component D1: (a) nominal CAD model; (b) μCT-derived STL surface; (c) supplied color-coded μCT-to-CAD deviation rendering. The scale bar indicates 3 mm and the displayed color represents ±0.2 mm deviation. Quantitative vertex summaries are calculated from the separate D1 export.

Fig. 3.

Component D2: (a) nominal CAD model; (b) μCT-derived STL surface; (c) supplied color-coded μCT-to-CAD deviation rendering. The scale bar indicates 3 mm, and the displayed color range represents ±0.7 mm deviation. The D1 and D2 colors represent different numeric scales.

Fig. 4.

Component D3: (a) nominal CAD model; (b) μCT-derived STL surface; (c) supplied color-coded μCT-to-CAD deviation rendering. The scale bar indicates 3 mm, and the displayed color range represents ±0.2 mm deviation.

Table 1.

Signed nearest-surface μCT-to-CAD deviations at the measured STL vertices.

MetricD1D2D3
N75 81246 95416 416
Mean5.2260.5222.55
Median9.2628.4813.12
SD48.86198.7173.70
RMS49.14207.7277.07
MAE35.32114.1748.71
Q0.95(|d|)92.08526.78191.73
Q0.99(|d|)136.92836.97248.90
Minimum−154.78−485.76−218.32
Maximum548.66877.96326.77

[i] All dimensional entries are in μm; each vertex has equal weight. SD uses divisor Nj − 1.

Fig. 5.

Vertex-based ECDFs of signed μCT-to-CAD nearest-surface deviations d (left) and absolute deviations |d| (right). The three curves use complete but differently meshed component surfaces.

Fig. 6.

Histograms of signed vertex deviations normalized to probability density (μm−1). The entire range (left) and central detail (right) use identical 20 μm bins and density values. Each full histogram has unit area.

Table 2.

Percentage of vertices with |d| ≤ Δ.

Δ (μm)D1D2D3
2038.6019.9444.17
5075.8946.9070.64
10096.2874.2584.90
20099.6585.8395.67
30099.8088.7699.94

[i] Half-widths Δ are illustrative, not component specifications.

Table 3.

Normality diagnostics and exploratory marginal fits for the full signed vertex-deviation exports.

QuantityD1D2D3
N75 81246 95416 416
Skewness1.341.880.88
Excess kurtosis12.055.562.37
AD statistic (normal)795.214414.05833.92
Nominal AD p≤ 0.0005≤ 0.0005≤ 0.0005
AIC (normal)−242577−18493−39028
AIC (Student’s t)−255007−62871−46548

[i] Skewness and kurtosis are dimensionless; AIC values use deviations in mm. AD p-values are conventional independent-observation reference calculations and are not valid inferential p-values for spatially dependent vertices.

Table 4.

Pairwise maximum distances between the vertex ECDFs of the three individual components.

Component pairDKS(d)DKS(|d|)
D1–D20.24740.2908
D1–D30.11110.1175
D2–D30.20920.2878

[i] “Signed” refers to d and “absolute” to |d|. The distances are descriptive measures of differences between these mesh-weighted distributions, not evidence of process-level differences.

Fig. 7.

Axial analysis of the D1 vertex deviations in 12 equal-width y intervals. Left: signed mean, RMS, and 95th percentile of |d|; right: percentage of vertices with |d| ≤ 100 μm. Shading marks interval 6, which contains every D1 vertex with |d| > 200 μm. Regional weights reflect local mesh density.

Fig. 8.

Rotational-axis diagnostics of μCT D1 aligned to CAD model. Upper: rendering of 75 812 STL vertices colored by axial region (colors identify regions, not deviation). Lower: 497 intervals along the rotation axis s; signed mean Δr, mean |Δr|, and 95th percentile of |Δr| are computed from 79 841 valid radial locations. The radial difference is defined relative to the recorded axis and must not be equated with the nearest-CAD-surface deviation in Fig. 7.

Language: English
Page range: 267 - 277
Submitted on: Jul 6, 2026
Accepted on: Aug 25, 2026
Published on: Oct 13, 2026
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open

© 2026 Miroslav Hain, Alexander Šatka, Tomáš Czán, Andrej Czán, Mário Drbúl, Jaromír Markovič, Viktor Witkovský, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.