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Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films Cover

Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films

Measurement Science Review
Volume 14 (2014): Issue 3 (June 2014)
By: N. Pompeo,  K. Torokhtii and  E. Silva  
Open Access
|Jun 2014

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DOI: https://doi.org/10.2478/msr-2014-0022 | Journal eISSN: 1335-8871
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Language: English
Page range: 164 - 170
Submitted on: Jul 25, 2013
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Accepted on: May 20, 2014
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Published on: Jun 17, 2014
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Microwave methods,
dielectric resonators,
superconductors,
surface impedance,
thin films,
low temperature
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2014 N. Pompeo, K. Torokhtii, E. Silva, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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