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Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry Cover

Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry

Measurement Science Review
Volume 13 (2013): Issue 2 (April 2013)
By: J. Hrabina,  J. Lazar,  M. Holá and  O. Číp  
Open Access
|Apr 2013
DOI: https://doi.org/10.2478/msr-2013-0014 | Journal eISSN: 1335-8871
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Language: English
Page range: 63 - 69
Published on: Apr 3, 2013
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nanometrology,
laser noise,
AFM,
spectroscopy,
interferometry
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2013 J. Hrabina, J. Lazar, M. Holá, O. Číp, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

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