Skip to main content
Have a personal or library account? Click to login
Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry Cover

Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry

Measurement Science Review
Volume 13 (2013): Issue 2 (April 2013)
By: ,  ,   and    
Open Access
|Apr 2013
References

References

  1. [1] Korpelainen, V., Seppa, J., Lassila, A. (2010). Design and characterization of MIKES metrological atomic force microscope., 34 (4), 735-744.
    Open DOISearch in Google Scholar
  2. [2] Otsuka, J., Ichikawa, S., Masuda, T., Suzuki, K. (2005). Development of a small ultraprecision positioning device with 5 nm resolution., 16 (11), 2186-2192.
    Open DOISearch in Google Scholar
  3. [3] Dai, G.L., Pohlenz, F., Danzebrink, H.U., Xu, M., Hasche, K., Wilkening, G. (2004). Metrological large range scanning probe microscope., 75 (4), 962-969.
    Open DOISearch in Google Scholar
  4. [4] Lazar, J., Cip, O., Cizek, M., Hrabina, J., Sery, M., Klapetek, P. (2010). Interferometer controlled positioning for nanometrology. In, 12-14 October 2010, 287-291.
    Search in Google Scholar
  5. [5] Kim, J.A., Kim, J.W., Park, B.C., Eom, T.B. (2006). Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope., 17 (7), 1792-1800.
    Open DOISearch in Google Scholar
  6. [6] Jäger, G., Gruenwald, R., Manske, E., Hausotte, T., Fuessl, R. (2004). A nanopositioning and nanomeasuring machine: Operation-measured results., 2, 81-84.
    Search in Google Scholar
  7. [7] Lazar, J., Hrabina, J., Sery, M., Klapetek, P., Cip, O. (2012). Multiaxis interferometric displacement measurement for local probe microscopy., 10 (1), 225-231.
    Open DOISearch in Google Scholar
  8. [8] Hrabina, J., Lazar, J., Klapetek, P., Cip, O. (2011). AFM nanometrology interferometric system with the compensation of angle errors. In. SPIE, Vol. 8082, art. no. 80823U.
    Open DOISearch in Google Scholar
  9. [9] Quinn, T.J. (1994). Mise-en-pratique of the definition of the meter (1992)., 30 (5), 523-541.
    Open DOISearch in Google Scholar
  10. [10] Ciddor, P.E., Bruce, C.F. (1981). Long-term stability of a thermally-stabilized He-Ne laser., 17 (1), 17-18.
    Open DOISearch in Google Scholar
  11. [11] Balhorn, R., Lebowsky, F., Kunzmann, H. (1972). Frequency stabilization of internal-mirror helium-neon lasers., 11 (4), 742.
    Open DOISearch in Google Scholar
  12. [12] Ciddor, P.E., Duffy, R.M. (1983). Two-mode frequency stabilized He-Ne (633 nm) lasers: Studies of short-term and long-term stability., 16 (12), 1223-1227.
    Search in Google Scholar
  13. [13] Hrabina, J., Petru, F., Jedlicka, P., Cip, O., Lazar, J. (2007). Purity of iodine cells and optical frequency shift of iodine-stabilized He-Ne lasers., 1 (5), 202-206.
    Search in Google Scholar
  14. [14] Sevcik, R., Guttenova, J. (2007). Primary length standard adjustment. In, 11-15 September 2007, 66-67.
    Search in Google Scholar
  15. [15] Bartl, J., Guttenova, J., Jacko, V., Sevcik, R. (2007). Circuits for optical frequency stabilization of metrological lasers. In20-24 May 2007. IMS SAS, 131-134.
    Search in Google Scholar
  16. [16] Holzwarth, R., Nevsky, A.Y., Zimmermann, M. et al. (2001). Absolute frequency measurement of iodine lines with a femtosecond optical synthesizer., 73 (3), 269-271.
    Open DOISearch in Google Scholar
  17. [17] Hrabina, J., Jedlicka, P., Lazar, J. (2008). Methods for measurement and verification of purity of iodine cells for laser frequency stabilization., 8 (5), 118-121.
    Open DOISearch in Google Scholar
  18. [18] Privalov, V.E., Shemanin, V.G., Voronina, E.I. (2010). Iodine molecules differential absorption cross section lidar studies., 10 (3), 108-110.
    Open DOISearch in Google Scholar
  19. [19] Simmons, J.D., Hougen, J.T. (1977). Atlas of I2 spectrum from 19 000 to 18 000 cm-1., 81 (1), 25-80.
    Search in Google Scholar
  20. [20] Hrabina, J., Lazar, J., Cip, O., Cizek, M. (2010). Laser source for interferometry in nanotechnology. In, 6-10 September, 2010. SPIE, Vol. 7746, art. no. 77461I.
    Search in Google Scholar
  21. [21] Cao, H.J., Zang, E.J., Zhao, K., Zhang, X.B., Wu, Y.X., Shen, N.C. (1998). Frequency stabilization of a Nd : YAG laser to Doppler-broadened lines of iodine near 532nm. In, 6-10 July 1998. IEEE, 183-184.
    Search in Google Scholar
  22. [22] Hrabina, J., Lazar, J., Klapetek, P., Cip, O. (2011). Multidimensional interferometric tool for the local probe microscopy nanometrology., 22 (9), art. no. 094030.
    Open DOISearch in Google Scholar
  23. [23] Lazar, J., Hola, M., Cip, O., Cizek, M., Hrabina, J., Buchta, Z. (2012). Displacement interferometry with stabilization of wavelength in air., 20 (25), 27830-27837.
    Open DOISearch in Google Scholar
  24. [24] Edlen, B. (1966). The refractive index of air., 2, 71-80.
    Open DOISearch in Google Scholar
  25. [25] Birch, K.P., Downs, M.J. (1994). Correction to the updated edlen equation for the refractive-index of air., 31 (4), 315-316.
    Open DOISearch in Google Scholar
  26. [26] Lazar, J., Hola, M., Cip, O., Cizek, M., Hrabina, J., Buchta, Z. (2012). Refractive index compensation in over-determined interferometric system., 12 (10), 14084-14094.
    Open DOISearch in Google Scholar
  27. [27] Quoc, T.B., Ishige, M., Ohkubo, Y., Aketagawa, M. (2009). Measurement of air-refractive-index fluctuation from laser frequency shift with uncertainty of order 10(-9)., 20 (12), art. no. 125302.
    Open DOISearch in Google Scholar
  28. [28] Lazar, J., Cip, O., Cizek, M., Hrabina, J., Buchta, Z. (2011). Standing wave interferometer with stabilization of wavelength on air., 78 (11), 484-488.
    Open DOISearch in Google Scholar
  29. [29] Zhang, J., Lu, Z.H., Menegozzi, B., Wang, L.J. (2006). Application of frequency combs in the measurement of the refractive index of air., 77 (8), art. no. 083104.
    Open DOISearch in Google Scholar
  30. [30] Lazar, J., Cip, O., Cizek, M., Hrabina, J., Buchta, Z. (2011). Suppression of air refractive index variations in high-resolution interferometry., 11 (8), 7644-7655.
    Open DOISearch in Google Scholar
  31. [31] Lazar, J., Cip, O., Cizek, M., Hrabina, J., Buchta, Z. (2010). Interferometry with direct compensation of fluctuations of refractive index of air. In, 6-10 September, 2010. SPIE, Vol. 7746, art. no. 77460E.
    Search in Google Scholar
  32. [32] Nyholm, K., Merimaa, M., Ahola, T., Lassila, A. (2003). Frequency stabilization of a diode-pumped Nd:Yag laser at 532 nm to iodine by using thirdharmonic technique., 52 (2), 284-287.
    Open DOISearch in Google Scholar
  33. [33] Nevsky, A.Y., Holzwarth, R., Reichert, J. et al. (2001). Frequency comparison and absolute frequency measurement of I-2-stabilized lasers at 532 nm., 192 (3-6), 263-272.
    Open DOISearch in Google Scholar
  34. [34] Rovera, G.D., Ducos, F., Zondy, J.J., Acef, O., Wallerand, J.P., Knight, J.C., Russell, P.S. (2002). Absolute frequency measurement of an I-2 stabilized Nd:YAG optical frequency standard., 13 (6), 918-922.
    Open DOISearch in Google Scholar
  35. [35] Galzerano, G., Bava, E., Bisi, M., Bertinetto, F., Svelto, C. (1998). Frequency stabilization of frequency-doubled Nd : YAG lasers at 532 nm. In, 6-10 July 1998. IEEE, 193-194.
    Search in Google Scholar
  36. [36] Galzerano, G., Bava, E., Bisi, M., Bertinetto, F., Svelto, C. (1999). Frequency stabilization of frequency-doubled Nd : YAG lasers at 532 nm by frequency modulation spectroscopy technique., 48 (2), 540-543.
    Open DOISearch in Google Scholar
  37. [37] Lazar, J., Hrabina, J., Jedlicka, P., Cip, O. (2009). Absolute frequency shifts of iodine cells for laser stabilization., 46 (5), 450-456.
    Open DOISearch in Google Scholar
  38. [38] Picard, S., Robertsson, L., Ma, L.S., Nyholm, K. et al. (2003). Comparison of 127I2-stabilized frequencydoubled Nd:YAG lasers at the Bureau International des Poids et Mesures., 42 (6), 1019-1028.
    Search in Google Scholar
  39. [39] Lance, A.L., Seal, W.D., Labaar, F. (1982). Phase noise measurement systems., 21 (4), 37-44.
    Search in Google Scholar
  40. [40] Badami, V.G., Patterson, S.R. (2000). A frequency domain method for the measurement of nonlinearity in heterodyne interferometry., 24 (1), 41-49.
    Open DOISearch in Google Scholar
  41. [41] Cip, O., Petru, F. (2000). A scale-linearization method for precise laser interferometry., 11 (2), 133-141.
    Search in Google Scholar
  42. [42] Eom, T., Kim, J., Jeong, K. (2001). The dynamic compensation of nonlinearity in a homodyne laser interferometer., 12 (10), 1734-1738.
    Open DOISearch in Google Scholar
  43. [43] Rerucha, S., Buchta, Z., Sarbort, M., Lazar, J., Cip, O. (2012). Detection of interference phase by digital computation of quadrature signals in homodyne laser interferometry., 12 (10), 14095-14112.
    Open DOISearch in Google Scholar
  44. [44] Siffalovic, P., Vegso, K., Jergel, M., Majkova, E. et al. (2010). Measurement of nanopatterned surfaces by real and reciprocal space techniques., 10 (5), 153-156.
    Open DOISearch in Google Scholar
  45. [45] Petru, F., Cip, O. (1999). Problems regarding linearity of data of a laser interferometer with a singlefrequency laser., 23 (1), 39-50.
    Open DOISearch in Google Scholar
  46. [46] Smid, R., Cip, O., Lazar, J. (2008). Precise length etalon controlled by stabilized frequency comb., 8 (5), 114-117.
    Search in Google Scholar
  47. [47] Meiners-Hagen, K., Schodel, R., Pollinger, F., Abou- Zeid, A. (2009). Multi-wavelength interferometry for length measurements using diode lasers., 9 (1), 16-26.
    Open DOISearch in Google Scholar
  48. [48] Petru, F., Popela, B., Vesela, Z. (1993). Design and performance of compact iodine stabilized He-Ne lasers at lambda=633 nm with a short optical resonator., 4 (4), 506-512.
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/msr-2013-0014 | Journal eISSN: 1335-8871
Journal RSS Feed
Language: English
Page range: 63 - 69
Published on: Apr 3, 2013
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Nanometrology,
laser noise,
AFM,
spectroscopy,
interferometry
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2013 J. Hrabina, J. Lazar, M. Holá, O. Číp, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons License.

Volume 13 (2013): Issue 2 (April 2013)
Previous article
Next article