X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co2FeAl) interfaced with semiconductor (n-Si) structure
By: Arvind Kumar and P.C. Srivastava
Authors
Arvind Kumar
Department of Physics, Atma Ram Sanatan Dharma College, University of Delhi, New Delhi, India
Department of Physics, Banaras Hindu University, Varanasi, India
P.C. Srivastava
Department of Physics, Banaras Hindu University, Varanasi, India
Language: English
Page range: 116 - 121
Submitted on: Mar 29, 2018
Accepted on: Jul 25, 2018
Published on: Mar 6, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2019 Arvind Kumar, P.C. Srivastava, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.