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X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co2FeAl) interfaced with semiconductor (n-Si) structure Cover

X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co2FeAl) interfaced with semiconductor (n-Si) structure

By: Arvind Kumar and  P.C. Srivastava  
Open Access
|Mar 2019

Abstract

Layered magnetic heterostructures are very promising candidates in spintronics in which the influences of interfaces, surfaces and defects play a crucial role. X-ray photoelectron spectroscopy (XPS) study has been performed for studying in detail the chemical state and electronic structure of Co2FeAl (CFA) Heusler alloy interfaced with Si substrates. XPS survey scan spectra have clearly shown the presence of Fe, Co and Al signal along with the signal due to Si. The presence of Co, Fe and Al signal confirms the formation of CFA alloy phase. Our XPS results support our previous study [1] on CFA/Si structure in determining the magnetic and transport properties across the interface.

DOI: https://doi.org/10.2478/msp-2019-0001 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 116 - 121
Submitted on: Mar 29, 2018
Accepted on: Jul 25, 2018
Published on: Mar 6, 2019
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2019 Arvind Kumar, P.C. Srivastava, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.