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Electrical performance estimation and comparative study of heterojunction strained and conventional gate all around nanosheet field effect transistors Cover

Electrical performance estimation and comparative study of heterojunction strained and conventional gate all around nanosheet field effect transistors

Open Access
|Dec 2023
DOI: https://doi.org/10.2478/jee-2023-0058 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 503 - 512
Submitted on: Oct 2, 2023
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Published on: Dec 14, 2023
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2023 Reza Abbasnezhad, Hassan Rasooli Saghai, Reza Hosseini, Aliasghar Sedghi, Ali Vahedi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.