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Analysis of porous silicon structures using FTIR and Raman spectroscopy Cover

Analysis of porous silicon structures using FTIR and Raman spectroscopy

By: Martin Králik and  Martin Kopani  
Open Access
|Jul 2023

References

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DOI: https://doi.org/10.2478/jee-2023-0028 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 218 - 227
Submitted on: Feb 21, 2023
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Published on: Jul 22, 2023
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2023 Martin Králik, Martin Kopani, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.