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Analysis of porous silicon structures using FTIR and Raman spectroscopy
By: Martin Králik and Martin Kopani
Language: English
Page range: 218 - 227
Submitted on: Feb 21, 2023
|Published on: Jul 22, 2023
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
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© 2023 Martin Králik, Martin Kopani, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.