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Analysis of porous silicon structures using FTIR and Raman spectroscopy Cover

Analysis of porous silicon structures using FTIR and Raman spectroscopy

Journal of Electrical Engineering
Volume 74 (2023): Issue 3 (June 2023)
By: Martin Králik and  Martin Kopani  
Open Access
|Jul 2023

Authors

Martin Králik

martin.kralik@feit.uniza.sk

Institute of Aurel Stodola, Faculty of Electrical Engineering and Information Technology, University of Zilina, Slovakia

Martin Kopani

Institute of Medical Physics, Biophysics, Informatics and Telemedicine, Faculty of Medicine, Comenius University, Slovakia
DOI: https://doi.org/10.2478/jee-2023-0028 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 218 - 227
Submitted on: Feb 21, 2023
|
Published on: Jul 22, 2023
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
electrochemical etching,
FTIR spectroscopy,
Raman spectroscopy,
porous silicon
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2023 Martin Králik, Martin Kopani, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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