Thickness and tensile stress determination of black silicon layers by spectral reflectance and Raman scattering
By: Martin Králik, Stanislav Jurečka and Emil Pinčík
Language: English
Page range: 51 - 57
Submitted on: Mar 19, 2019
|Published on: Sep 28, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
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© 2019 Martin Králik, Stanislav Jurečka, Emil Pinčík, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.