Investigation on Photoelectric Theodolite data Processing and Random Errors Model
By:
Metrics
DOI: https://doi.org/10.21307/ijssis-2017-802 | Journal eISSN: 1178-5608
Language: English
Page range: 1180 - 1202
Submitted on: Jan 26, 2015
Accepted on: Apr 18, 2015
Published on: Nov 20, 2017
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 times per year
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© 2017 Xiang Hua, Jinjin Zhang, Bin Lei, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.