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Investigation on Photoelectric Theodolite data Processing and Random Errors Model Cover

Investigation on Photoelectric Theodolite data Processing and Random Errors Model

By: Xiang Hua,  Jinjin Zhang and  Bin Lei  
Open Access
|Nov 2017

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Language: English
Page range: 1180 - 1202
Submitted on: Jan 26, 2015
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Accepted on: Apr 18, 2015
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Published on: Nov 20, 2017
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year

© 2017 Xiang Hua, Jinjin Zhang, Bin Lei, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.