Investigation on Photoelectric Theodolite data Processing and Random Errors Model
By:
Authors
Xiang Hua
School of Electronic Information Engineering, Xi’an Technological University, Xi’an, China
Jinjin Zhang
School of Electronic Information Engineering, Xi’an Technological University, Xi’an, China
Bin Lei
School of Electronic Information Engineering, Xi’an Technological University, Xi’an, China
DOI: https://doi.org/10.21307/ijssis-2017-802 | Journal eISSN: 1178-5608
Language: English
Page range: 1180 - 1202
Submitted on: Jan 26, 2015
Accepted on: Apr 18, 2015
Published on: Nov 20, 2017
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 times per year
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© 2017 Xiang Hua, Jinjin Zhang, Bin Lei, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.