Have a personal or library account? Click to login
Investigation on Photoelectric Theodolite data Processing and Random Errors Model Cover

Investigation on Photoelectric Theodolite data Processing and Random Errors Model

International Journal on Smart Sensing and Intelligent Systems
Volume 8 (2015): Issue 2 (January 2015)
By: Xiang Hua,  Jinjin Zhang and  Bin Lei  
Open Access
|Nov 2017

Authors

Xiang Hua

huaxiang79@126.com

School of Electronic Information Engineering, Xi’an Technological University, Xi’an, China

Jinjin Zhang

xixiangxiang@gmail.com

School of Electronic Information Engineering, Xi’an Technological University, Xi’an, China

Bin Lei

gropenind@163.com

School of Electronic Information Engineering, Xi’an Technological University, Xi’an, China
DOI: https://doi.org/10.21307/ijssis-2017-802 | Journal eISSN: 1178-5608
Journal RSS Feed
Language: English
Page range: 1180 - 1202
Submitted on: Jan 26, 2015
|
Accepted on: Apr 18, 2015
|
Published on: Nov 20, 2017
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
photoelectric theodolite,
data process,
error model,
random error,
error estimate
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2017 Xiang Hua, Jinjin Zhang, Bin Lei, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Previous articleVolume 8 (2015): Issue 2 (January 2015)Next article