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A Novel Dynamic Method to Improve First-order Natural Frequency for Test Device Cover

A Novel Dynamic Method to Improve First-order Natural Frequency for Test Device

Open Access
|Oct 2018

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Language: English
Page range: 183 - 192
Submitted on: Feb 20, 2018
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Accepted on: Sep 10, 2018
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Published on: Oct 17, 2018
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open

© 2018 Jun Zhang, Yu Tian, Zongjin Ren, Jun Shao, Zhenyuan Jia, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.