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A Novel Dynamic Method to Improve First-order Natural Frequency for Test Device Cover

A Novel Dynamic Method to Improve First-order Natural Frequency for Test Device

Measurement Science Review
Volume 18 (2018): Issue 5 (October 2018)
By: Jun Zhang,  Yu Tian,  Zongjin Ren,  Jun Shao and  Zhenyuan Jia  
Open Access
|Oct 2018

Authors

Jun Zhang

Zhangj@dlut.edu.cn

Faculty of Mechanical engineering, Dalian University of Technology,, Dalian, China

Yu Tian

Faculty of Mechanical engineering, Dalian University of Technology,, Dalian, China

Zongjin Ren

Faculty of Mechanical engineering, Dalian University of Technology,, Dalian, China

Jun Shao

Faculty of Mechanical engineering, Dalian University of Technology,, Dalian, China

Zhenyuan Jia

Faculty of Mechanical engineering, Dalian University of Technology,, Dalian, China
DOI: https://doi.org/10.1515/msr-2018-0026 | Journal eISSN: 1335-8871
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Language: English
Page range: 183 - 192
Submitted on: Feb 20, 2018
|
Accepted on: Sep 10, 2018
|
Published on: Oct 17, 2018
Published by: Slovak Academy of Sciences, Institute of Measurement Science
In partnership with: Paradigm Publishing Services
Publication frequency: Volume open
Keywords:
Natural frequency,
dynamic analysis,
Lagrange dynamic method,
structure improvement,
test device
Related subjects:
Engineering,
Electrical engineering,
Control engineering, metrology and testing

© 2018 Jun Zhang, Yu Tian, Zongjin Ren, Jun Shao, Zhenyuan Jia, published by Slovak Academy of Sciences, Institute of Measurement Science
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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